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Product name: XQ15-GI激光平面干涉仪
specification: XQ15-GI激光平面干涉仪
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Category: instrumentation and meters -- 光学仪器
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Price: factory price
Brand: 上光
Place of Origin: China
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Available Quantity: batch
delivery cycle: Spot goods (or inquire by telephone)
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  Shanghai Beiyuan Industry and Trade Co.,Ltd
+86-21-66770508
+86-139101609058

Email 91way@163.com
Wechat 13901609058(Wechat)


XQ15-GI激光平面干涉仪Detailed product description:Column tabs
产品简介:
1、防震性能好、有极好的条纹锁定度、视场清晰、生产场所可用性优于市场同类产品,大容量的
2、工作室为大批量生产企业的大镜面检测提供了方便。

XQ15-GI 激光平面干涉仪技术参数:

1、第一标准平面(A面),工作直径D1=φ146mm,平面的面形偏差小于0.03μm(λ/20)
2、第二标准平面(B面),工作直径D2=φ140mm,平面的面形偏差小于0.03μm(λ/20)
3、准直系统:工作直径φ146mm,孔径F/2.8,焦距f=400mm
4、测微目镜:焦距f=16.7mm;
5、视场角:2W=40?;放大倍数β=15X
6、成像物镜:D=7,F=16
7、光源规格:ZN18(He-Ne)
8、干涉室尺:φ480*380*285mm

XQ15-GI激光平面干涉仪
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