SZT-2A Semiconductor material four probe testerDetailed product description：

SZT-2A semiconductor material four probe tester

The host adopts advanced circuit design, and the measured values are more precise, faster, and accurate (the first generation is a traditional circuit, which has disadvantages such as large size, slow speed, and numerous components that affect the machine's lifespan).
2. The screen adopts LCD display (the first generation only has digital tube display), and is integrated with manual (automatic is standard, manual handheld is optional).
3. Matching computer interfaces and software (with 232 interface and USB interface), making operation simple and clear (can be directly connected to a computer, the computer can automatically calculate, compare and correct coefficients according to the specified thickness input, making the measured results more accurate, data can be stored or deleted, which is convenient for users to save records). This function is an optional accessory.
4. The second-generation test stand adopts an automatic sensing device, which automatically decelerates when approaching the tested object, avoiding the wear and tear of the tested object and probe (leading any similar product test stand in the domestic market, the older generation was manual).
When testing resistance, resistivity, and block resistance with this instrument, the standard coefficients are automatically calculated with the selection key, eliminating the need for manual adjustment and saving a lot of trouble with the original instrument.
The maximum resolution of the SZT-2A semiconductor material four probe tester is 0.1m Ω.
7. The test probe is a tungsten needle, which is commonly used in the market as a high-speed steel needle.
8. Each measurement has a built-in computer that automatically compensates for temperature and corrects voltage and current.
9. Measurement standard uncertainty of the whole machine: ≤ 2% (error of other domestic manufacturers is ≤ 5%)

10. Technical parameters of SZT-2A semiconductor material four probe tester:
1) Measurement range:
Electrical resistivity: 10 ^ -4 ^ -10 ^ -5 ^ - Ω - cm
Block resistance: 10 ^ -4 ^ -10 ^ -5 ^ Ω/□
Resistance: 10 ^ -4 to 10 ^ -5 Ω
2) Measurable semiconductor material dimensions
Diameter: 5mm-130mm
Length: ≤ 400mm
If a handheld probe is used, the size range can be extended
3) Measurement method:
Both axial and cross-sectional directions are acceptable
4) Display mode: 41/2, digital display, polarity and overload automatic display, decimal point and unit automatic display.
5) Constant current source:
(1) Current output: DC current 0~100 mA
(2) Range: 10, 100 μ A, 1, 10, 100mA
(3) Error: ± 0.5% reading ± 1 word
6). Four probe testing probe
(1) Probe spacing: 1mm
(2) Material: Tungsten carbide Probe mechanical drift rate: ± 1.0%
7). Power supply: 220 ± 10% 50Hz or 60Hz Power consumption: ＜ 35W

Both axial and cross-sectional directions are acceptable
4) Display mode: 41/2, digital display, polarity and overload automatic display, decimal point and unit automatic display.
5) Constant current source:
(1) Current output: DC current 0~100 mA
(2) Range: 10, 100 μ A, 1, 10, 100mA
(3) Error: ± 0.5% reading ± 1 word

6). Four probe testing probe
(1) Probe spacing: 1mm
(2) Material: Tungsten carbide Probe mechanical drift rate: ± 1.0%
7). Power supply: 220 ± 10% 50Hz or 60Hz Power consumption: ＜ 35W