SZT-5 Type Material Composite TesterDetailed product description：

1、 Overview;
The SZT-5 material composite tester is composed of two types of silicon material testing instruments combined
1. A two range resistance measuring instrument, equipped with a handheld four pin test head or a seated test stand, can be used to measure sheet, column, or block resistivity
Semiconductor materials within the range of 0.01 to 200 ohms per centimeter. By adjusting the constant current source, certain measurement results can be adjusted. For example, the test results of ordinary silicon materials need to be multiplied by an exploration head correction factor of 0.628, and the correction factor for thin layer diffusion and conductive film "block resistance" of silicon materials is 4.53. All of these can be processed by adjusting the constant current.
The SZT-4 digital four probe tester is compact in size, easy to operate, and has a moderate range, making it very suitable for sorting recycled materials.
2. The rectification method silicon material P-N polarity discriminator is equipped with a three pin handheld probe, which can detect sheet or block resistivity ranging from 1000-0.01 ohms/cm. Polarity discrimination of silicon materials
The working environment conditions of this instrument are:
Temperature: 18 ℃ -25 ℃
Relative humidity: 50% -70%
There should be no strong electric field interference in the studio, and power should not be shared with high-frequency equipment.

2、 Technical parameters of SZT-5 material composite tester
1. Measurement range
(1) Electrical resistivity measurement:
Resistance 0.01-200 Ω - cm
Block resistance 0.01-200 Ω - port
Resistance 0.01-200.0 Ω
2. Digital voltmeter
(1) Range: 200mV single range
(2) Error: Reading ± 0.2% ± 3 words
(3) Input resistance:>10M Ω
3. Constant current source
(1) Current output: 0~10mA continuously adjustable
(2) Range: 1mA, 10mA
(3) Error: ± 0.2% ± 3 words,
4. Handheld four probe test head
(a) Probe spacing: 1mm
(b) Probe mechanical drift rate: ± 1.0%
(c) Probe material: tungsten carbide, φ0.
(d) Pressure: Maximum 2Kg
(2) Conductivity type discrimination:
It can be used to determine the conductivity type of silicon materials with a resistivity of 1000-0.01 ohms/cm, and can also indicate through sound and light alarms that the tested material belongs to "heavy doping".