M-2 digital resistivity testerDetailed product description：

The M-2 digital resistivity tester is a multi-purpose comprehensive measuring device that uses the four probe measurement principle. It can measure the radial and axial resistivity of sheet and block semiconductor materials, as well as measure the sheet resistance (also known as block resistance) of the diffusion layer. By using a specially designed four probe testing fixture, it is also possible to measure the low and median resistance of metal conductors.
The instrument consists of a host, a test probe (optional test bench), and other parts, and the test results are directly displayed using a digital meter head. The host is mainly composed of a CNC constant current source, high-resolution ADC, embedded microcontroller system, and automatic range conversion. The test probe is made of highly wear-resistant tungsten carbide probe, which has accurate positioning, low drift rate, and long service life.
The instrument is suitable for testing the resistance performance of semiconductor materials in semiconductor material factories, semiconductor device factories, research institutions, and universities. Especially suitable for situations that require rapid measurement of low to medium resistivity
The working conditions of this instrument are:
temperature
Relative humidity: 60%~70%
There should be no strong electromagnetic field interference in the studio, and power should not be shared with high-frequency equipment

Technical parameters of M-2 digital resistivity tester
1. Measurement range:
Electrical resistivity: 10-2~102 Ω - cm
Block resistance: 10-1~103 Ω/□
Resistance: 10-3~9999 Ω
2. Measurable semiconductor material dimensions
Diameter: 15mm-100mm
Length (or height): ≤ 400mm
3. Measurement direction:
Both axial and radial directions are acceptable
4. Digital voltmeter
Range: 2V
Error: ± 0.1% FSB ± 2LSB
Maximum resolution: 10 μ A
Accuracy: 18 bit ADC (5 1/2 bits)
Display: 4-digit display, decimal point automatically displayed
5. CNC constant current source
Current output: DC current 2 μ A~2mA, 2 μ A step adjustable, system automatically adjusts.
Error: ± 0.1% FSB ± 0.5LSB
6. Four probe test probe:
Probe spacing: 1mm
Probe mechanical drift rate: ± 1%
Probe: Tungsten carbide, diameter 0.5mm
7. Power supply:
DC 4.5V ~8V
Power consumption:<1W
Power adapter: Input: 220V ± 10% 50Hz
Output: DC5V ± 10%
8. External dimensions:
Host: 170mm (length) X 130mm (width) X50mm (height)