SZT-1 Digital Four Point Probe TesterDetailed product description：

The SZT-1 digital four probe tester is a multi-purpose comprehensive measurement device that uses the four probe measurement principle. It can measure the radial and axial resistivity of sheet and fast semiconductor materials, measure the resistivity of sheet semiconductor materials and the sheet resistance (square resistance) of diffusion layers. With a specially designed four probe test clip, it can also measure the low median resistance of metal conductors. In addition, after special processing, the probe can also measure the resistivity of thin film materials. Widely applicable to semiconductor materials, device factories, chemical physics departments of higher education institutions, and research units, for testing the resistance performance of semiconductor materials.
The testing probe of this instrument adopts a gemstone guide shaft sleeve and a high wear-resistant tungsten carbide probe, with accurate positioning, low drift rate, and long service life.

Technical parameters of SZT-1 digital four probe tester:
1. Measurement range:
Electrical resistivity: 10 ^ -4 ^ -10 ^ -3 ^ - Ω - cm
Block resistance: 10 ^ -3 ^ -10 ^ -4 ^ Ω/□
Resistance: 10 ^ -6 ^ -10 ^ -5 ^ - Ω
Conductivity type identification: resistivity range of 10 ^ -4 ^ -10 ^ -3 ^ - Ω - cm
2. Measurable semiconductor material dimensions
Diameter: 15~100 mm
Length: ≤ 400mm
3. Measurement method:
Both axial and cross-sectional directions are acceptable
4. Display mode: 31/2, digital display, polarity and overload automatic display, decimal point and unit automatic display.
5. Constant current source:
(1) Current output: DC current continuously adjustable from 0 to 100 mA.
(2) Range: 10, 100 μ A, 1, 10, 100mA
(3) Error: ± 0.5% reading ± 2 words
6. Four probe testing probe
(1) Probe spacing: 1mm
(2) Material: Tungsten carbide Probe mechanical drift rate: ± 1.0%
7. Power supply: 220 ± 10% 50Hz or 60Hz Power consumption: ＜ 35W