SZT-2C Four probe testerDetailed product description：

The SZT-2C four probe tester adopts advanced circuits for its main unit, resulting in more precise, faster, and accurate measurement values (the first generation is a traditional circuit, which has disadvantages such as large size, slow speed, and numerous components that affect the machine's lifespan).
2. The screen adopts a color LCD display (the first generation only had a digital display).
3. Matching computer interfaces and software to make operation simple and clear (can be directly connected to a computer, the computer performs automatic calculations based on the specified thickness input, automatically compares and corrects coefficients, making the measured results more accurate, and the data can be stored or deleted, which is convenient for users to save records). This is an optional accessory.
The testing table on the SZT-2C testing stand is 100mm longer and wider than the traditional testing stand, to meet the needs of testing large pieces (if customers have special requirements for the size of the testing machine, we can also customize according to their size). It adopts an automatic sensing device, which automatically decelerates when approaching the tested object, avoiding the loss of the tested object and the wear of the probe (leading any similar product testing stand in the domestic market, the older generation is manual), and can also improve the measurement accuracy.
5. When testing resistance, resistivity, and block resistance with this instrument, the standard coefficients are automatically adjusted by the machine itself, eliminating the need for manual adjustment and saving a lot of trouble with the original instrument. (The pressure of this instrument can be adjusted in three levels, and this function is an optional accessory)
The minimum resolution of this instrument is 0.1m Ω
7. The host has an integrated manual and automatic function, and the testing rack can be completed manually and automatically without the need for two additional sets.
8. The test probe is a tungsten needle, which is commonly used in the market as a high-speed steel needle.
9. Each measurement has a built-in computer that automatically compensates for temperature and corrects voltage and current.
10. Measurement standard uncertainty of the whole machine: ≤ 2% (error of other domestic manufacturers is ≤ 5%)

Technical parameters of SZT-2C four probe tester:
1) Measurement range:
Electrical resistivity: 10-5-105 Ω. cm
Block resistance: 10 ^ -4 ^ -10 ^ -6 ^ - Ω/□
Resistance: 10-5-105 Ω;
·2) Measurable semiconductor material dimensions
Diameter: 5mm-250mm
Length: Any (requires a test probe)
·3) Measurement method:
Both axial and cross-sectional directions are acceptable
4) Display mode: 41/2, digital display, polarity and overload automatic display, decimal point and unit automatic display.
5) Constant current source:
(1) Current output: DC current continuously adjustable from 0 to 100 mA. The range and representation of the continuously adjustable digital voltmeter for each current range are 000.00 to 199.99 mV;
(2) Range: 1, 10, 100 μ A, 1, 10, 100mA
(3) Error: ± 0.5% reading ± 1 word
(4) Resolution: 10 μ V; Input impedance>1000M Ω; accuracy: ± 0.1%;
6). Four probe testing probe
(1) Probe spacing: 1 ± 0.01mm;
(2) Material: Tungsten carbide Probe mechanical drift rate: ≤ 0.3%;
(3) Probe pressure: 5-16 Newtons (total force);
7) The maximum relative error of the whole machine measurement (tested with silicon standard sample: 0.01-180 Ω· cm) is ≤± 5%
8) Power supply: 220 ± 10% 50Hz or 60Hz Power consumption: ＜ 35W
9) Computer communication interface: parallel port, high-speed parallel data acquisition. When connected to a computer for use, it only takes 1.5 seconds to collect data to the computer (in the range of 0.1mA, 1mA, 10mA, and 100mA). Connect to the computer and use the automatic measurement function to automatically select the appropriate current range for sample testing.