SZT-2B Type Four Probe TesterDetailed product description：

SZT-2B Four Probe Tester
1. The host adopts advanced circuit design, and the measured values are more precise, faster, and accurate (the first generation is a traditional circuit, which has disadvantages such as large size, slow speed, and numerous components that affect the machine's lifespan).
2. The screen adopts LCD display (the first generation only had digital display).
3. Matching computer interfaces and software to make operation simple and clear (can be directly connected to a computer, the computer performs automatic calculations based on the specified thickness input, automatically compares and corrects coefficients, making the measured results more accurate, and the data can be stored or deleted, which is convenient for users to save records). This is an optional accessory.
The testing table on the SZT-2B testing rack is 100mm longer and wider than the traditional testing rack to meet the needs of testing large areas. It adopts an automatic sensing device that automatically decelerates when approaching the tested object, avoiding the wear of the tested object and probe (leading any similar product testing rack in the domestic market, the older generation is manual), and can also improve measurement accuracy.
5. When testing resistance, resistivity, and block resistance with this instrument, the standard coefficients are automatically adjusted by the machine itself, eliminating the need for manual adjustment and saving a lot of trouble with the original instrument.
The minimum resolution of this instrument is 0.1m Ω
7. The host has an integrated manual and automatic function, and the testing rack can be completed manually and automatically without the need for two additional sets.
8. The test probe is a tungsten needle, which is commonly used in the market as a high-speed steel needle.
9. Each measurement has a built-in computer that automatically compensates for temperature and corrects voltage and current.
10. Measurement standard uncertainty of the whole machine: ≤ 2% (error of other domestic manufacturers is ≤ 5%)

Technical parameters of SZT-2B four probe tester: 1)
Measuring range:
Electrical resistivity: 10 ^ -4 ^ -10 ^ -6 ^ - Ω - cm
Block resistance: 10 ^ -4 ^ -10 ^ -6 ^ - Ω/□
Resistance: 10 ^ -4 ^ -10 ^ -6 ^ - Ω
2) Measurable semiconductor material dimensions
Diameter: 5mm-250mm
Length: Any (requires a test probe)
3) Measurement method:
Both axial and cross-sectional directions are acceptable
4) Display mode: 41/2, digital display, polarity and overload automatic display, decimal point and unit automatic display.
5) Constant current source:
(1) Current output: DC current continuously adjustable from 0 to 100 mA.
(2) Range: 1, 10, 100 μ A, 1, 10, 100mA
(3) Error: ± 0.5% reading ± 1 word
6). Four probe testing probe
(1) Probe spacing: 1mm
(2) Material: Tungsten carbide Probe mechanical drift rate: ± 1.0%
7). Power supply: 220 ± 10% 50Hz or 60Hz Power consumption: ＜ 35W